2008 .9. 17 1/3 semiconductor technical data kic7s32fu silicon monolithic cmos digital integrated circuit revision no : 2 2-input or gate the kic7s32fu is a high speed c 2 mos 2-input or gate fabricated with silicon gate c 2 mos technology. it achieves high speed operation similar to equivalent lsttl while maintaining the c 2 mos low power dissipation. the internal circuit is composed of 2 stages including buffer output, which enables high noise immunity and stable output. all inputs are equipped with protection circuits against static discharge or transient excess voltage. features ? high speed : t pd =7ns(typ.) at v cc =5v. ? low power dissipation : i cc =1 a(max.) at ta=25 ? . ? high noise immunity : v nih =v nil =28% v cc (min.). ? output drive capability : 5 lsttl loads. ? symmetrical output impedance : | i oh | =i ol =2ma(min.) ? balanced propagation delays : t plh ?? t phl ? wide operating voltage range : v cc(opr) =2 ?- 6v. dim millimeters a b d g usv 2.00 0.20 1.25 0.1 2.1 0.1 0.2+0.10/-0.05 0-0.1 0.9 0.1 0.65 0.15+0.1/-0.05 b1 h c t g 1 3 2 b b1 d a h t 5 4 c c a1 1.3 0.1 a1 + _ + _ + _ + _ + _ maximum ratings (ta=25 ? ) marking type name lot no. sv pin connection (top view) 1 2 3 4 5v cc out y in b in a gnd characteristic symbol rating unit supply voltage range v cc -0.5 ?- 7 v dc input voltage v in -0.5 ?- v cc +0.5 v dc output voltage v out -0.5 ?- v cc +0.5 v input diode current i ik ?? 20 ma output diode current i ok ?? 20 ma dc output current i out ?? 12.5 ma dc v cc /ground current i cc ?? 25 ma power dissipation p d 200 mw storage temperature t stg -65 ?- 150 ? lead temperature (10s) t l 260 ?
2008. 9. 17 2/3 kic7s32fu revision no : 2 in b (1) (2) (4) in a out y 1 logic diagram recommended operating conditions dc electrical characteristics characteristic symbol rating unit supply voltage v cc 2 ?- 6 v input voltage v in 0 ?- v cc v output voltage v out 0 ?- v cc v operating temperature t opr -40 ?- 85 ? input rise and fall time t r , t f 0 ?- 1000 (v cc =2.0v) 0 ?- 500 (v cc =4.5v) 0 ?- 400 (v cc =6.0v) ns characteristic symbol test condition ta=25 ? ta=-40 ?- 85 ? unit v cc min. typ. max. min. max. high-level input voltage v ih - 2.0 4.5 6.0 1.5 3.15 4.2 - - - - - - 1.5 3.15 4.2 - - - v low-level input voltage v il - 2.0 4.5 6.0 - - - - - - 0.5 1.35 1.8 - - - 0.5 1.35 1.8 v high-level output voltage v oh v in =v ih or v il i oh =-20 a 2.0 4.5 6.0 1.9 4.4 5.9 2.0 4.5 6.0 - - - 1.9 4.4 5.9 - - - v i oh =-2ma i oh =-2.6ma 4.5 6.0 4.18 5.68 4.31 5.80 - - 4.13 5.63 - - low-level output voltage v ol v in =v il i ol =20 a 2.0 4.5 6.0 - - - 0.0 0.0 0.0 0.1 0.1 0.1 - - - 0.1 0.1 0.1 v i ol =2ma i ol =2.6ma 4.5 6.0 - - 0.17 0.18 0.26 0.26 - - 0.33 0.33 input leakage current i in v in =v cc or gnd 6.0 - - ?? 0.1 - ?? 1.0 a quiescent supply current i cc v in =v cc or gnd 6.0 - - 1.0 - 10.0
2008. 9. 17 3/3 kic7s32fu revision no : 2 ac electrical characteristics (c l =15pf, input t r =t f =6ns, v cc =5v) ac electrical characteristics (c l =50pf, input t r =t f =6ns) note 1 : c pd defined as the value of internal equivalent capacitance of ic which is calculated from the operating current consumption without load (refer to test circuit.) average operating current can be obtained by the equation hereunder. : i cc(opr) =c pd ? v cc ? f in + i cc switching characteristics test circuit i cc(opr) test circuit characteristic symbol test condition ta=25 ? unit min. typ. max. output transition time t tlh t thl - - 5 10 ns propagation delay time t plh t phl - - 7 15 ns characteristic symbol test condition ta=25 ? ta=-40 ?- 85 ? unit v cc min. typ. max. min. max. output transition time t tlh t thl - 2.0 4.5 6.0 - - - 50 14 12 125 25 21 - - - 155 31 26 ns propagation delay time t plh t phl - 2.0 4.5 6.0 - - - 48 12 9 100 20 17 - - - 125 25 21 ns input capacitance c in - - 5 10 - 10 pf power dissipation capacitance c pd (note 1) - 10 - - - p.g. v in v cc out v l c 50 ? 6ns 6ns 90% 50% 10% v cc gnd t tlh t thl in v v out oh v v ol 90% 50% 10% t plh phl t 50 ? p.g. a v =5v cc v in v out input waveform is the same as that in case of switching characteristics test.
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